Hieu V. Nguyen, Li Bai. Cosine Similarity Metric Learning for Face Verification. In Ron Kimmel, Reinhard Klette, Akihiro Sugimoto, editors, Computer Vision - ACCV 2010 - 10th Asian Conference on Computer Vision, Queenstown, New Zealand, November 8-12, 2010, Revised Selected Papers, Part II. Volume 6493 of Lecture Notes in Computer Science, pages 709-720, Springer, 2010. [doi]
Abstract is missing.