Nguyen P. Nguyen, Ilker Ersoy, Tommi White, Filiz Bunyak. Automated Particle Picking in Cryo-Electron Micrographs using Deep Regression. In Huiru Jane Zheng, Zoraida Callejas, David Griol, Haiying Wang, Xiaohua Hu, Harald Schmidt, Jan Baumbach, Julie Dickerson, Le Zhang, editors, IEEE International Conference on Bioinformatics and Biomedicine, BIBM 2018, Madrid, Spain, December 3-6, 2018. pages 2453-2460, IEEE, 2018. [doi]
Abstract is missing.