Phuc Nguyen, Khai Nguyen, Ryutaro Ichise, Hideaki Takeda 0001. EmbNum: Semantic Labeling for Numerical Values with Deep Metric Learning. In Ryutaro Ichise, Freddy Lécué, Takahiro Kawamura, Dongyan Zhao, Stephen Muggleton, Kouji Kozaki, editors, Semantic Technology - 8th Joint International Conference, JIST 2018, Awaji, Japan, November 26-28, 2018, Proceedings. Volume 11341 of Lecture Notes in Computer Science, pages 119-135, Springer, 2018. [doi]
@inproceedings{NguyenNI018,
title = {EmbNum: Semantic Labeling for Numerical Values with Deep Metric Learning},
author = {Phuc Nguyen and Khai Nguyen and Ryutaro Ichise and Hideaki Takeda 0001},
year = {2018},
doi = {10.1007/978-3-030-04284-4_9},
url = {https://doi.org/10.1007/978-3-030-04284-4_9},
researchr = {https://researchr.org/publication/NguyenNI018},
cites = {0},
citedby = {0},
pages = {119-135},
booktitle = {Semantic Technology - 8th Joint International Conference, JIST 2018, Awaji, Japan, November 26-28, 2018, Proceedings},
editor = {Ryutaro Ichise and Freddy Lécué and Takahiro Kawamura and Dongyan Zhao and Stephen Muggleton and Kouji Kozaki},
volume = {11341},
series = {Lecture Notes in Computer Science},
publisher = {Springer},
isbn = {978-3-030-04284-4},
}