Robust Feature Extraction for Facial Image Quality Assessment

Thi Hai Binh Nguyen, Van Huan Nguyen, Hakil Kim. Robust Feature Extraction for Facial Image Quality Assessment. In Yongwha Chung, Moti Yung, editors, Information Security Applications - 11th International Workshop, WISA 2010, Jeju Island, Korea, August 24-26, 2010, Revised Selected Papers. Volume 6513 of Lecture Notes in Computer Science, pages 292-306, Springer, 2010. [doi]

Abstract

Abstract is missing.