Design and evaluation of features and classifiers for OLED panel defect recognition in machine vision

Van Huan Nguyen, Van Huy Pham, Xuenan Cui, Mingjie Ma, Hakil Kim. Design and evaluation of features and classifiers for OLED panel defect recognition in machine vision. J. Information Telecommunication, 1(4):334-350, 2017. [doi]

Abstract

Abstract is missing.