A Novel Approach to Reducing Testing Costs and Minimizing Defect Escapes Using Dynamic Neighborhood Range and Shapley Values - researchr publication

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Tianming Ni, Wangsheng Rui, Cheng Zhuo, Yu Li 0007, Xiaoqing Wen, Mu Nie. A Novel Approach to Reducing Testing Costs and Minimizing Defect Escapes Using Dynamic Neighborhood Range and Shapley Values. ACM Trans. Design Autom. Electr. Syst., 31(4), July 2026. [doi]

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