Modelling and Analysis of Manufacturing Variability Effects from Process to Architectural Level

Chenxi Ni, Ziyad Al Tarawneh, Gordon Russell, Alexandre V. Bystrov. Modelling and Analysis of Manufacturing Variability Effects from Process to Architectural Level. In José L. Ayala, Delong Shang, Alex Yakovlev, editors, Integrated Circuit and System Design. Power and Timing Modeling, Optimization and Simulation, 22nd International Workshop, PATMOS 2012, Newcastle upon Tyne, UK, September 4-6, 2012, Revised Selected Papers. Volume 7606 of Lecture Notes in Computer Science, pages 11-20, Springer, 2012. [doi]

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