A Memory Built-In Self-Repair for High Defect Densities Based on Error Polarities

Michael Nicolaidis, Nadir Achouri, Lorena Anghel. A Memory Built-In Self-Repair for High Defect Densities Based on Error Polarities. In 18th IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems (DFT 2003), 3-5 November 2003, Boston, MA, USA, Proceedings. pages 459-466, IEEE Computer Society, 2003. [doi]

Abstract

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