Test Generation for Current Testing (CMOS ICs)

Phil Nigh, Wojciech Maly. Test Generation for Current Testing (CMOS ICs). IEEE Design & Test of Computers, 7(1):26-38, 1990. [doi]

@article{NighM90,
  title = {Test Generation for Current Testing (CMOS ICs)},
  author = {Phil Nigh and Wojciech Maly},
  year = {1990},
  doi = {10.1109/54.46891},
  url = {http://doi.ieeecomputersociety.org/10.1109/54.46891},
  tags = {testing},
  researchr = {https://researchr.org/publication/NighM90},
  cites = {0},
  citedby = {0},
  journal = {IEEE Design & Test of Computers},
  volume = {7},
  number = {1},
  pages = {26-38},
}