Expected vectorless Teacher-Student Swap (TSS) test method with dual power supply voltages for 0.3V homogeneous multi-core LSI's

Taro Niiyama, Koichi Ishida, Makoto Takamiya, Takayasu Sakurai. Expected vectorless Teacher-Student Swap (TSS) test method with dual power supply voltages for 0.3V homogeneous multi-core LSI's. In Proceedings of the IEEE 2008 Custom Integrated Circuits Conference, CICC 2008, DoubleTree Hotel, San Jose, California, USA, September 21-24, 2008. pages 137-140, IEEE, 2008. [doi]

Authors

Taro Niiyama

This author has not been identified. Look up 'Taro Niiyama' in Google

Koichi Ishida

This author has not been identified. Look up 'Koichi Ishida' in Google

Makoto Takamiya

This author has not been identified. Look up 'Makoto Takamiya' in Google

Takayasu Sakurai

This author has not been identified. Look up 'Takayasu Sakurai' in Google