Expected vectorless Teacher-Student Swap (TSS) test method with dual power supply voltages for 0.3V homogeneous multi-core LSI's

Taro Niiyama, Koichi Ishida, Makoto Takamiya, Takayasu Sakurai. Expected vectorless Teacher-Student Swap (TSS) test method with dual power supply voltages for 0.3V homogeneous multi-core LSI's. In Proceedings of the IEEE 2008 Custom Integrated Circuits Conference, CICC 2008, DoubleTree Hotel, San Jose, California, USA, September 21-24, 2008. pages 137-140, IEEE, 2008. [doi]

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