Expected vectorless Teacher-Student Swap (TSS) test method with dual power supply voltages for 0.3V homogeneous multi-core LSI's

Taro Niiyama, Koichi Ishida, Makoto Takamiya, Takayasu Sakurai. Expected vectorless Teacher-Student Swap (TSS) test method with dual power supply voltages for 0.3V homogeneous multi-core LSI's. In Proceedings of the IEEE 2008 Custom Integrated Circuits Conference, CICC 2008, DoubleTree Hotel, San Jose, California, USA, September 21-24, 2008. pages 137-140, IEEE, 2008. [doi]

@inproceedings{NiiyamaITS08,
  title = {Expected vectorless Teacher-Student Swap (TSS) test method with dual power supply voltages for 0.3V homogeneous multi-core LSI's},
  author = {Taro Niiyama and Koichi Ishida and Makoto Takamiya and Takayasu Sakurai},
  year = {2008},
  doi = {10.1109/CICC.2008.4672040},
  url = {http://dx.doi.org/10.1109/CICC.2008.4672040},
  researchr = {https://researchr.org/publication/NiiyamaITS08},
  cites = {0},
  citedby = {0},
  pages = {137-140},
  booktitle = {Proceedings of the IEEE 2008 Custom Integrated Circuits Conference, CICC 2008, DoubleTree Hotel, San Jose, California, USA, September 21-24, 2008},
  publisher = {IEEE},
  isbn = {978-1-4244-2018-6},
}