Special Session: Photonic IC Testing - Challenges and Opportunities

Manoj Niraula, Vipul Patel, Prakash Gothoskar, Attila Mekis, Gary Evans, Xuezhe Zheng. Special Session: Photonic IC Testing - Challenges and Opportunities. In 37th IEEE VLSI Test Symposium, VTS 2019, Monterey, CA, USA, April 23-25, 2019. pages 1, IEEE, 2019. [doi]

@inproceedings{NiraulaPGMEZ19,
  title = {Special Session: Photonic IC Testing - Challenges and Opportunities},
  author = {Manoj Niraula and Vipul Patel and Prakash Gothoskar and Attila Mekis and Gary Evans and Xuezhe Zheng},
  year = {2019},
  doi = {10.1109/VTS.2019.8758631},
  url = {https://doi.org/10.1109/VTS.2019.8758631},
  researchr = {https://researchr.org/publication/NiraulaPGMEZ19},
  cites = {0},
  citedby = {0},
  pages = {1},
  booktitle = {37th IEEE VLSI Test Symposium, VTS 2019, Monterey, CA, USA, April 23-25, 2019},
  publisher = {IEEE},
  isbn = {978-1-7281-1170-4},
}