Y. Nishimura, M. Hamada, H. Hidaka, H. Ozaki, K. Fujishima, Y. Hayasaka. Redundancy Test for 1 Mbit DRAM Using Multi-Bit-Test Mode. In Proceedings International Test Conference 1986, Washington, D.C., USA, September 1986. pages 826-829, IEEE Computer Society, 1986.
Abstract is missing.