Speaker Siglet Detection for Business Microscope

Jun Nishimura, Nobuo Sato, Tadahiro Kuroda. Speaker Siglet Detection for Business Microscope. In M. Arif Wani, Xue-wen Chen, David Casasent, Lukasz A. Kurgan, Tony Hu, Khalid Hafeez, editors, Seventh International Conference on Machine Learning and Applications, ICMLA 2008, San Diego, California, USA, 11-13 December 2008. pages 376-381, IEEE Computer Society, 2008. [doi]

Abstract

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