0.45-V operating Vt-variation tolerant 9T/18T dual-port SRAM

Hiroki Noguchi, Shunsuke Okumura, Tomoya Takagi, Koji Kugata, Masahiko Yoshimoto, Hiroshi Kawaguchi. 0.45-V operating Vt-variation tolerant 9T/18T dual-port SRAM. In Proceedings of the 12th International Symposium on Quality Electronic Design, ISQED 2011, Santa Clara, California, USA, 14-16 March 2011. pages 219-222, IEEE, 2011. [doi]

Abstract

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