Reliability issues and length dependence of nanocrystalline graphene field-effect transistors for gas sensing - researchr publication authors

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D. Noll, Udo Schwalke. Reliability issues and length dependence of nanocrystalline graphene field-effect transistors for gas sensing. In 14th International Conference on Design & Technology of Integrated Systems In Nanoscale Era, DTIS 2019, Mykonos, Greece, April 16-18, 2019. pages 1-5, IEEE, 2019. [doi]

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