D. Noll, Udo Schwalke. Reliability issues and length dependence of nanocrystalline graphene field-effect transistors for gas sensing. In 14th International Conference on Design & Technology of Integrated Systems In Nanoscale Era, DTIS 2019, Mykonos, Greece, April 16-18, 2019. pages 1-5, IEEE, 2019. [doi]
@inproceedings{NollS19,
title = {Reliability issues and length dependence of nanocrystalline graphene field-effect transistors for gas sensing},
author = {D. Noll and Udo Schwalke},
year = {2019},
doi = {10.1109/DTIS.2019.8734953},
url = {https://doi.org/10.1109/DTIS.2019.8734953},
researchr = {https://researchr.org/publication/NollS19},
cites = {0},
citedby = {0},
pages = {1-5},
booktitle = {14th International Conference on Design & Technology of Integrated Systems In Nanoscale Era, DTIS 2019, Mykonos, Greece, April 16-18, 2019},
publisher = {IEEE},
isbn = {978-1-7281-3424-6},
}