T. Nonaka, K. Imai, T. Hiramatsu. Evaluation of geometric accuracy and the features of TanDEM-X. In Claudia Notarnicola, Simonetta Paloscia, Nazzareno Pierdicca, editors, SAR Image Analysis, Modeling, and Techniques XI, SPIE Remote Sensing, Prague, Czech Republic, 19-22 September 2011. Volume 8179 of SPIE Proceedings, pages 817915, SPIE, 2011. [doi]
Abstract is missing.