Orthogonal Scan: Low-Overhead Scan for Data Paths

Robert B. Norwood, Edward J. McCluskey. Orthogonal Scan: Low-Overhead Scan for Data Paths. In Proceedings IEEE International Test Conference 1996, Test and Design Validity, Washington, DC, USA, October 20-25, 1996. pages 659-668, IEEE Computer Society, 1996.

Abstract

Abstract is missing.