Test Pattern Decompression Using a Scan Chain

Ondrej Novák, Jiri Nosek. Test Pattern Decompression Using a Scan Chain. In 16th IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems (DFT 2001), 24-26 October 2001, San Francisco, CA, USA, Proceedings. pages 110-115, IEEE Computer Society, 2001. [doi]

Abstract

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