Ondrej Novák, Jiri Nosek. Test Pattern Decompression Using a Scan Chain. In 16th IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems (DFT 2001), 24-26 October 2001, San Francisco, CA, USA, Proceedings. pages 110-115, IEEE Computer Society, 2001. [doi]
@inproceedings{NovakN01,
title = {Test Pattern Decompression Using a Scan Chain},
author = {Ondrej Novák and Jiri Nosek},
year = {2001},
url = {http://computer.org/proceedings/dft/1203/12030110abs.htm},
tags = {testing},
researchr = {https://researchr.org/publication/NovakN01},
cites = {0},
citedby = {0},
pages = {110-115},
booktitle = {16th IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems (DFT 2001), 24-26 October 2001, San Francisco, CA, USA, Proceedings},
publisher = {IEEE Computer Society},
isbn = {0-7695-1203-8},
}