Technology variability and uncertainty implications for power- efficient VLSI systems

Kevin J. Nowka. Technology variability and uncertainty implications for power- efficient VLSI systems. In Vojin G. Oklobdzija, Barry Pangle, Naehyuck Chang, Naresh R. Shanbhag, Chris H. Kim, editors, Proceedings of the 2010 International Symposium on Low Power Electronics and Design, 2010, Austin, Texas, USA, August 18-20, 2010. pages 239-240, ACM, 2010. [doi]

Abstract

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