History-sensitive recovery of product line features

Camila Nunes, Alessandro Garcia, Carlos José Pereira de Lucena. History-sensitive recovery of product line features. In 26th IEEE International Conference on Software Maintenance (ICSM 2010), September 12-18, 2010, Timisoara, Romania. pages 1-2, IEEE Computer Society, 2010. [doi]

Abstract

Abstract is missing.