Digital High-Resolution Melt Platform for Rapid and Parallelized Molecule-by-Molecule Genetic Profiling

Christine M. O'Keefe. Digital High-Resolution Melt Platform for Rapid and Parallelized Molecule-by-Molecule Genetic Profiling. In 40th Annual International Conference of the IEEE Engineering in Medicine and Biology Society, EMBC 2018, Honolulu, HI, USA, July 18-21, 2018. pages 5342-5345, IEEE, 2018. [doi]