Marginal PCB assembly defect detection on DDR3/4 memory bus

Sergei Odintsov, Artur Jutman, Sergei Devadze. Marginal PCB assembly defect detection on DDR3/4 memory bus. In IEEE International Test Conference, ITC 2017, Fort Worth, TX, USA, October 31 - Nov. 2, 2017. pages 1-10, IEEE, 2017. [doi]

Abstract

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