Can Ökmen, Martin Keim, Rolf Krieger, Bernd Becker. On Optimizing BIST-Architecture by Using OBDD-based Approaches and Genetic Algorithms. In 15th IEEE VLSI Test Symposium (VTS 97), April 27-May 1, 1997, Monterey, California, USA. pages 426-433, IEEE Computer Society, 1997. [doi]
Abstract is missing.