A Methodology for Chip-Level Electromigration Risk Assessment and Product Qualification - researchr publication authors

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Chanhee Oh, Haldun Haznedar, Martin Gall, Amir Grinshpon, Vladimir Zolotov, Pon Sung Ku, Rajendran Panda. A Methodology for Chip-Level Electromigration Risk Assessment and Product Qualification. In 5th International Symposium on Quality of Electronic Design (ISQED 2004), 22-24 March 2004, San Jose, CA, USA. pages 232-237, IEEE Computer Society, 2004. [doi]

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