Chanhee Oh, Haldun Haznedar, Martin Gall, Amir Grinshpon, Vladimir Zolotov, Pon Sung Ku, Rajendran Panda. A Methodology for Chip-Level Electromigration Risk Assessment and Product Qualification. In 5th International Symposium on Quality of Electronic Design (ISQED 2004), 22-24 March 2004, San Jose, CA, USA. pages 232-237, IEEE Computer Society, 2004. [doi]
@inproceedings{OhHGGZKP04,
title = {A Methodology for Chip-Level Electromigration Risk Assessment and Product Qualification},
author = {Chanhee Oh and Haldun Haznedar and Martin Gall and Amir Grinshpon and Vladimir Zolotov and Pon Sung Ku and Rajendran Panda},
year = {2004},
url = {http://csdl.computer.org/comp/proceedings/isqed/2004/2093/00/20930232abs.htm},
researchr = {https://researchr.org/publication/OhHGGZKP04},
cites = {0},
citedby = {0},
pages = {232-237},
booktitle = {5th International Symposium on Quality of Electronic Design (ISQED 2004), 22-24 March 2004, San Jose, CA, USA},
publisher = {IEEE Computer Society},
isbn = {0-7695-2093-6},
}