A Methodology for Chip-Level Electromigration Risk Assessment and Product Qualification

Chanhee Oh, Haldun Haznedar, Martin Gall, Amir Grinshpon, Vladimir Zolotov, Pon Sung Ku, Rajendran Panda. A Methodology for Chip-Level Electromigration Risk Assessment and Product Qualification. In 5th International Symposium on Quality of Electronic Design (ISQED 2004), 22-24 March 2004, San Jose, CA, USA. pages 232-237, IEEE Computer Society, 2004. [doi]

@inproceedings{OhHGGZKP04,
  title = {A Methodology for Chip-Level Electromigration Risk Assessment and Product Qualification},
  author = {Chanhee Oh and Haldun Haznedar and Martin Gall and Amir Grinshpon and Vladimir Zolotov and Pon Sung Ku and Rajendran Panda},
  year = {2004},
  doi = {http://csdl.computer.org/comp/proceedings/isqed/2004/2093/00/20930232abs.htm},
  researchr = {https://researchr.org/publication/OhHGGZKP04},
  cites = {0},
  citedby = {0},
  pages = {232-237},
  booktitle = {5th International Symposium on Quality of Electronic Design (ISQED 2004), 22-24 March 2004, San Jose, CA, USA},
  publisher = {IEEE Computer Society},
  isbn = {0-7695-2093-6},
}