Hyunggoy Oh, Heetae Kim, Sangjun Lee, Sungho Kang. Dynamic voltage Drop induced Path Delay Analysis for STV and NTV Circuits during At-speed Scan Test. In International SoC Design Conference, ISOCC 2018, Daegu, South Korea, November 12-15, 2018. pages 7-8, IEEE, 2018. [doi]
Abstract is missing.