Il-Seok Oh, Jin-Seon Lee, Ching Y. Suen. Using class separation for feature analysis and combination of class-dependent features. In Anil K. Jain, Svetha Venkatesh, Brian C. Lovell, editors, Fourteenth International Conference on Pattern Recognition, ICPR 1998, Brisbane, Australia, 16-20 August, 1998. pages 453-455, IEEE, 1998. [doi]
Abstract is missing.