Hiroyuki Ohde, Haruhiko Kaneko, Eiji Fujiwara. Low-Density Triple-Erasure Correcting Codes for Dependable Distributed Storage Systems. In 21th IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems (DFT 2006), 4-6 October 2006, Arlington, Virginia, USA. pages 175-183, IEEE Computer Society, 2006. [doi]
Abstract is missing.