Hajime Oi, Rei Kawakami, Takeshi Nacmura. Analysis of Evaluation Metrics with the Distance between Positive Pairs and Negative Pairs in Deep Metric Learning. In 17th International Conference on Machine Vision and Applications, MVA 2021, Aichi, Japan, July 25-27, 2021. pages 1-5, IEEE, 2021. [doi]
Abstract is missing.