Researchr is a web site for finding, collecting, sharing, and reviewing scientific publications, for researchers by researchers.
Sign up for an account to create a profile with publication list, tag and review your related work, and share bibliographies with your co-authors.
Paul Okino. Test Time Impact of Redundancy Repair in Embedded Flash Memory. In Proceedings IEEE International Test Conference 2002, Baltimore, MD, USA, October 7-10, 2002. pages 1220, IEEE Computer Society, 2002. [doi]
Abstract is missing.