A leakage current monitor circuit using silicon on thin BOX MOSFET for dynamic back gate bias control - researchr publication

researchr

You are not signed in
Sign in
Sign up

Hayate Okuhara, Kimiyoshi Usami, Hideharu Amano. A leakage current monitor circuit using silicon on thin BOX MOSFET for dynamic back gate bias control. In 2015 IEEE Symposium in Low-Power and High-Speed Chips, COOL CHIPS XVIII, Yokohama, Japan, April 13-15, 2015. pages 1-3, IEEE, 2015. [doi]

Abstract is missing.

runs on WebDSL