Kei Okumura, Hiroyuki Okamura, Tadashi Dohi. On the Effect of the Order of Test Cases in the Modified Exponential Software Reliability Growth Model. In Second International Conference on Networking and Computing, ICNC 2011, November 30 - December 2, 2011, Osaka, Japan. pages 294-296, IEEE Computer Society, 2011. [doi]
Abstract is missing.