Roystein Oliveira, Aditya Jagirdar, Tapan J. Chakraborty. A TMR Scheme for SEU Mitigation in Scan Flip-Flops. In 8th International Symposium on Quality of Electronic Design (ISQED 2007), 26-28 March 2007, San Jose, CA, USA. pages 905-910, IEEE Computer Society, 2007. [doi]
Abstract is missing.