Daniel A. G. de Oliveira, Laércio Lima Pilla, Nathan DeBardeleben, Sean Blanchard, Heather Quinn, Israel Koren, Philippe O. A. Navaux, Paolo Rech. Experimental and analytical study of Xeon Phi reliability. In Bernd Mohr, Padma Raghavan, editors, Proceedings of the International Conference for High Performance Computing, Networking, Storage and Analysis, SC 2017, Denver, CO, USA, November 12 - 17, 2017. pages 28, ACM, 2017. [doi]
Abstract is missing.