Semiu A. Olowogemo, Hao Qiu, Bor-Tyng Lin, William H. Robinson, Daniel B. Limbrick. Model-Based Analysis of Single-Event Upset (SEU) Vulnerability of 6T SRAM Using FinFET Technologies. In Luca Cassano, Sreejit Chakravarty, Alberto Bosio, editors, IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2022, Austin, TX, USA, October 19-21, 2022. pages 1-4, IEEE, 2022. [doi]
Abstract is missing.