Multisine With Optimal Phase-Plane Uniformity for ADC Testing

Meng Sang Ong, Ye Chow Kuang, Poon Shern Liam, Melanie Po-Leen Ooi. Multisine With Optimal Phase-Plane Uniformity for ADC Testing. IEEE T. Instrumentation and Measurement, 61(3):566-578, 2012. [doi]

Abstract

Abstract is missing.