Bejoy G. Oomman, Wu-Tung Cheng, John A. Waicukauski. A Universal Technique for Accelerating Simulation of Scan Test Patterns. In Proceedings IEEE International Test Conference 1996, Test and Design Validity, Washington, DC, USA, October 20-25, 1996. pages 135-141, IEEE Computer Society, 1996.
Abstract is missing.