Analysis of SRAM neutron-induced errors based on the consideration of both charge-collection and parasitic-bipolar failure modes - researchr publication

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Kenichi Osada, Naoki Kitai, Shiro Kamohara, Takayuki Kawahara. Analysis of SRAM neutron-induced errors based on the consideration of both charge-collection and parasitic-bipolar failure modes. In Proceedings of the IEEE 2004 Custom Integrated Circuits Conference, CICC 2004, Orlando, FL, USA, October 2004. pages 357-360, IEEE, 2004. [doi]

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