High-Volume Testing and DC Offset Trimming Technique of On-Die Bandgap Voltage Reference for SOCs and Microprocessors

Takao Oshita, Jonathan Douglas, Arun Krishnamoorthy. High-Volume Testing and DC Offset Trimming Technique of On-Die Bandgap Voltage Reference for SOCs and Microprocessors. IEEE Trans. VLSI Syst., 27(4):821-829, 2019. [doi]

Abstract

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