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A Compact First-Order $\Sigma\Delta $ Modulator for Analog High-Volume Testing of Complex System-on-Chips in a 14 nm Tri-Gate Digital CMOS Process

Takao Oshita, Joseph Shor, David E. Duarte, Avner Kornfeld, George L. Geannopoulos, Jonathan Douglas, Nasser A. Kurd. A Compact First-Order $\Sigma\Delta $ Modulator for Analog High-Volume Testing of Complex System-on-Chips in a 14 nm Tri-Gate Digital CMOS Process. J. Solid-State Circuits, 51(2):378-390, 2016. [doi]

Authors

Takao Oshita

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Joseph Shor

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David E. Duarte

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Avner Kornfeld

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George L. Geannopoulos

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Jonathan Douglas

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Nasser A. Kurd

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