Automated Incremental Pairwise Testing of Software Product Lines

Sebastian Oster, Florian Markert, Philipp Ritter. Automated Incremental Pairwise Testing of Software Product Lines. In Jan Bosch, Jaejoon Lee, editors, Software Product Lines: Going Beyond - 14th International Conference, SPLC 2010, Jeju Island, South Korea, September 13-17, 2010. Proceedings. Volume 6287 of Lecture Notes in Computer Science, pages 196-210, Springer, 2010. [doi]

@inproceedings{OsterMR10,
  title = {Automated Incremental Pairwise Testing of Software Product Lines},
  author = {Sebastian Oster and Florian Markert and Philipp Ritter},
  year = {2010},
  doi = {10.1007/978-3-642-15579-6_14},
  url = {http://dx.doi.org/10.1007/978-3-642-15579-6_14},
  tags = {software product lines, Variability-Aware Analysis, testing, analysis, context-aware, incremental},
  researchr = {https://researchr.org/publication/OsterMR10},
  cites = {0},
  citedby = {0},
  pages = {196-210},
  booktitle = {Software Product Lines: Going Beyond - 14th International Conference, SPLC 2010, Jeju Island, South Korea, September 13-17, 2010. Proceedings},
  editor = {Jan Bosch and Jaejoon Lee},
  volume = {6287},
  series = {Lecture Notes in Computer Science},
  publisher = {Springer},
  isbn = {978-3-642-15578-9},
}