Sebastian Oster, Florian Markert, Philipp Ritter. Automated Incremental Pairwise Testing of Software Product Lines. In Jan Bosch, Jaejoon Lee, editors, Software Product Lines: Going Beyond - 14th International Conference, SPLC 2010, Jeju Island, South Korea, September 13-17, 2010. Proceedings. Volume 6287 of Lecture Notes in Computer Science, pages 196-210, Springer, 2010. [doi]
@inproceedings{OsterMR10,
title = {Automated Incremental Pairwise Testing of Software Product Lines},
author = {Sebastian Oster and Florian Markert and Philipp Ritter},
year = {2010},
doi = {10.1007/978-3-642-15579-6_14},
url = {http://dx.doi.org/10.1007/978-3-642-15579-6_14},
tags = {software product lines, Variability-Aware Analysis, testing, analysis, context-aware, incremental},
researchr = {https://researchr.org/publication/OsterMR10},
cites = {0},
citedby = {0},
pages = {196-210},
booktitle = {Software Product Lines: Going Beyond - 14th International Conference, SPLC 2010, Jeju Island, South Korea, September 13-17, 2010. Proceedings},
editor = {Jan Bosch and Jaejoon Lee},
volume = {6287},
series = {Lecture Notes in Computer Science},
publisher = {Springer},
isbn = {978-3-642-15578-9},
}