Timm Ostermann. On power BSD test of integrated circuits. In 24th International Conference Mixed Design of Integrated Circuits and Systems, MIXDES 2017, Bydgoszcz, Poland, June 22-24, 2017. pages 412-415, IEEE, 2017. [doi]
@inproceedings{Ostermann17,
title = {On power BSD test of integrated circuits},
author = {Timm Ostermann},
year = {2017},
doi = {10.23919/MIXDES.2017.8005243},
url = {https://doi.org/10.23919/MIXDES.2017.8005243},
researchr = {https://researchr.org/publication/Ostermann17},
cites = {0},
citedby = {0},
pages = {412-415},
booktitle = {24th International Conference Mixed Design of Integrated Circuits and Systems, MIXDES 2017, Bydgoszcz, Poland, June 22-24, 2017},
publisher = {IEEE},
isbn = {978-83-63578-12-1},
}