TEM-cell and surface scan to identify the electromagnetic emission of integrated circuits

Timm Ostermann, Bernd Deutschmann. TEM-cell and surface scan to identify the electromagnetic emission of integrated circuits. In Proceedings of the 13th ACM Great Lakes Symposium on VLSI 2003, Washington, DC, USA, April 28-29, 2003. pages 76-79, ACM, 2003. [doi]

Abstract

Abstract is missing.