Characterization of the EME of integrated circuits with the help of the IEC standard 61967 [electromagnetic emission]

Timm Ostermann, Bernd Deutschmann. Characterization of the EME of integrated circuits with the help of the IEC standard 61967 [electromagnetic emission]. In 8th European Test Workshop, ETW 2003, Maastricht, The Netherlands, May 25-28, 2003. pages 132-137, IEEE Computer Society, 2003. [doi]

Abstract

Abstract is missing.