Mayu Otani, Riku Togashi, Yuta Nakashima, Esa Rahtu, Janne Heikkilä, Shin'ichi Satoh 0003. Optimal Correction Cost for Object Detection Evaluation. In IEEE/CVF Conference on Computer Vision and Pattern Recognition, CVPR 2022, New Orleans, LA, USA, June 18-24, 2022. pages 21075-21083, IEEE, 2022. [doi]
Abstract is missing.