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Yiming Ouyang, Lizhu Hu, Yifeng Wu, Jianfeng Yang, Kun Xing. Dynamic Fine-Grain Power Gating Design in WiNoC. In 27th IEEE Asian Test Symposium, ATS 2018, Hefei, China, October 15-18, 2018. pages 139-148, IEEE, 2018. [doi]
Abstract is missing.